Polarization ellipse and Stokes parameters in geometric algebra

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• JOSA A, Vol. 29, Issue 1, pp. 89-98 (January 2012)
• Adler G. Santos, Quirino M. Sugon, Jr., Daniel J. McNamara

Spectrally resolving single-shot polarimeter

• Abstract

• Optics Letters, Vol. 36, Issue 16, pp. 3048-3050 (August 2011)
• Sebastian Knitter, Tim Hellwig, Michael Kues, Carsten Fallnich

Super-resolution for imagery from integrated microgrid polarimeters

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• Optics Express, Vol. 19, Issue 14, pp. 12937-12960 (July 2011)
• Russell C. Hardie, Daniel A. LeMaster, Bradley M. Ratliff

Band limited data reconstruction in modulated polarimeters

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• Optics Express, Vol. 19, Issue 16, pp. 14976-14989 (August 2011)
• Charles F. LaCasse, Russell A. Chipman, J. Scott Tyo

Monte-Carlo-based phase retardation estimator for polarization sensitive optical coherence tomography

• Abstract
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• Optics Express, Vol. 19, Issue 17, pp. 16330-16345 (August 2011)
• Lian Duan, Shuichi Makita, Masahiro Yamanari, Yiheng Lim, Yoshiaki Yasuno

Snapshot phase sensitive scatterometry based on double-channel spectral carrier frequency concept

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• Optics Express, Vol. 19, Issue 24, pp. 23790-23799 (November 2011)
• Daesuk Kim, Hyunsuk Kim, Robert Magnusson, Yong Jai Cho, Won Chegal, Hyun Mo Cho

Entangled photon polarimetry

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• Optics Express, Vol. 19, Issue 27, pp. 26011-26016 (December 2011)
• Joseph B. Altepeter, Neal N. Oza, Milja Medić, Evan R. Jeffrey, Prem Kumar

Ellipsometry with randomly varying polarization states

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• Optics Express, Vol. 20, Issue 2, pp. 870-878 (January 2012)
• Feng Liu, Chris J. Lee, Juequan Chen, Eric Louis, Peter J. M. van der Slot, Klaus J. Boller, Fred Bijkerk

Spectroscopic ellipsometry as an optical probe of strain evolution in ferroelectric thin films

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• Optics Express, Vol. 20, Issue 4, pp. 4419-4427 (February 2012)
• D. Y. Lei, S. Kéna-Cohen, B. Zou, P. K. Petrov, Y. Sonnefraud, J. Breeze, S. A. Maier, N. M. Alford

Spectral polarimetry technique as a complementary tool to ellipsometry of dielectric films

• Abstract

• Applied Optics, Vol. 50, Issue 9, pp. C420-C423 (March 2011)
• Marcelo B. Pereira, Bruno J. Barreto, Flavio Horowitz

Spectroscopic ellipsometer based on direct measurement of polarization ellipticity

• Abstract

• Applied Optics, Vol. 50, Issue 18, pp. 2973-2978 (June 2011)
• Lionel R. Watkins

Polar decomposition of the Mueller matrix: a polarimetric rule of thumb for square-profile surface structure recognition

• Abstract

• Applied Optics, Vol. 50, Issue 21, pp. 3781-3788 (July 2011)
• J. M. Sanz, J. M. Saiz, F. González, F. Moreno

Ellipsometric study of dielectric functions of Mg_1−yCa_yH_x thin films (0.03≤y≤0.17)

• Abstract

• Applied Optics, Vol. 50, Issue 21, pp. 3879-3884 (July 2011)
• Yasusei Yamada, Kazuki Tajima, Masahisa Okada, Masato Tazawa, Arne Roos, Kazuki Yoshimura

Evaluation of Kerr constant of blue-phase liquid crystals by measuring off-axis retardation in vertical electric field cells

• Abstract

• Applied Optics, Vol. 50, Issue 27, pp. 5299-5302 (September 2011)
• Pao-Ju Hsieh, Huang-Ming Philip Chen

Optimized Stokes polarimeters based on a single twisted nematic liquid-crystal device for the minimization of noise propagation

• Abstract

• Applied Optics, Vol. 50, Issue 28, pp. 5437-5445 (October 2011)
• Alba Peinado, Angel Lizana, Josep Vidal, Claudio Iemmi, Juan Campos

Comparison of quarter-wave retarders over finite spectral and angular bandwidths for infrared polarimetric-imaging applications

• Abstract

• Applied Optics, Vol. 50, Issue 36, pp. 6682-6688 (December 2011)
• Samuel L. Wadsworth, Glenn D. Boreman

Full-field characterization of a twisted nematic liquid-crystal device using equivalence theorem of a unitary optical system

• Abstract

• Applied Optics, Vol. 51, Issue 2, pp. 238-244 (January 2012)
• Chih-Jen Yu, Yao-Teng Tseng, Kuei-Chu Hsu, Chien Chou

Imaging ellipsometry based method and algorithm for the analysis of fiber–fiber bonds in a paper network

• Abstract

• Applied Optics, Vol. 51, Issue 2, pp. 273-280 (January 2012)
• Eduard Gilli, Robert Schennach

Ellipsometry study on gold-nanoparticle-coated gold thin film for biosensing application

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• Biomedical Optics Express, Vol. 2, Issue 9, pp. 2569-2576 (September 2011)
• Rakesh Singh Moirangthem, Yia-Chung Chang, Pei-Kuen Wei

Optical properties of silver nanoparticles thermally grown in a mesostructured hybrid silica film

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• Optical Materials Express, Vol. 1, Issue 5, pp. 1019-1033 (September 2011)
• Y. Battie, N. Destouches, F. Chassagneux, D. Jamon, L. Bois, N. Moncoffre, N. Toulhoat