Abstract

A rapid scanning microscope has been designed and used to light-probe the response of semiconductor devices and to observe their infrared emission and transmission. The heart of this system is a single mirror that vibrates on two perpendicular axes to deflect a light beam into a raster pattern. The single mirror scanner is relatively easy to construct, can be used with standard microscope components, and yet allows for useful wide angle deflections and a large field of view.

© 1971 Optical Society of America

Scanned Laser Infrared Microscope

B. Sherman and J. F. Black
Appl. Opt. 9(4) 802-809 (1970)

Scanning Laser Microscope for Biological Investigations

P. Davidovits and M. D. Egger
Appl. Opt. 10(7) 1615-1619 (1971)

Reflective Relay Optics for Use in Laser Deflection Systems

R. J. Anderson and C. Larson
Appl. Opt. 10(7) 1605-1608 (1971)

Problem of Infrared Television-Camera Tubes vs Infrared Scanners

J. A. Hall
Appl. Opt. 10(4) 838-844 (1971)

Electrooptic Laser Scanner for TV Projection Display

J. D. Beasley
Appl. Opt. 10(8) 1934-1936 (1971)