Abstract
The total number, energy, and angular distribution of backscattered electrons at 200–4000 V incident energy have been measured for clean (111)B GaAs surfaces. From the electron reflection data the modulalation transfer functions for transmission secondary electron emitters are calculated.
© 1972 Optical Society of America
Full Article | PDF ArticleMore Like This
I. L. Kofsky, J. D. Geller, and C. S. Miller
Appl. Opt. 11(10) 2340-2346 (1972)
Ling Ren, Feng Shi, Hui Guo, Honggang Wang, and Benkang Chang
Appl. Opt. 52(8) 1641-1645 (2013)
F. A. Rosell, E. L. Svensson, and R. H. Willson
Appl. Opt. 11(5) 1058-1067 (1972)