Expand this Topic clickable element to expand a topic
Skip to content
Optica Publishing Group

Effect of Refractive Index Gradients on Index Measurement by the Abeles Method

Not Accessible

Your library or personal account may give you access

Abstract

Abeles’s method of determining the refractive index of a thin film is discussed. Attention is directed to the effect of a graded index transition between the film and the substrate on the measured index. First, a closed-form analysis of the problem for a long transition region is given. This is followed by a computer analysis applicable to transition regions of any length.

© 1972 Optical Society of America

Full Article  |  PDF Article
More Like This
Effect of film transition layers on the Abeles method

Ikuo Awai and Jun-ichi Ikenoue
Appl. Opt. 23(11) 1890-1896 (1984)

Abelès method revisited

Petre C. Logofatu, Dan Apostol, Victor Damian, Iuliana M. Iordache, Mihaela M. Bojan, and Raluca Müller
Appl. Opt. 45(6) 1120-1123 (2006)

Cited By

You do not have subscription access to this journal. Cited by links are available to subscribers only. You may subscribe either as an Optica member, or as an authorized user of your institution.

Contact your librarian or system administrator
or
Login to access Optica Member Subscription

Figures (6)

You do not have subscription access to this journal. Figure files are available to subscribers only. You may subscribe either as an Optica member, or as an authorized user of your institution.

Contact your librarian or system administrator
or
Login to access Optica Member Subscription

Equations (20)

You do not have subscription access to this journal. Equations are available to subscribers only. You may subscribe either as an Optica member, or as an authorized user of your institution.

Contact your librarian or system administrator
or
Login to access Optica Member Subscription

Select as filters


Select Topics Cancel
© Copyright 2024 | Optica Publishing Group. All Rights Reserved