Abstract

Spatial filtering techniques used to detect thin phase structures can be represented by a unique transfer function (phase-contrast function, PhCF). The PhCF is here formulated in terms of mathematical symmetry to define, analyze, and classify schlieren techniques (ST). It is shown that all ST can be identified by essentially the same PhCF. This latter function performs a passband Hilbert transformation under coherent illumination. It can also act as a differential filter provided that the illumination is noncoherent.

© 1979 Optical Society of America

Effect of spherical aberration on the imaging properties of scanning optical microscopes

C. J. R. Sheppard and T. Wilson
Appl. Opt. 18(7) 1058-1063 (1979)

Flexible bandpass filtering using a coherent optical feedback technique

E. Händler and U. Röder
Appl. Opt. 18(16) 2787-2791 (1979)

Optical statistical classifiers using coherent and incoherent light

J. Duvernoy
Appl. Opt. 18(16) 2737-2745 (1979)

Guided-wave optical thin-film Luneburg lenses: fabrication technique and properties

S. K. Yao, D. B. Anderson, R. R. August, B. R. Youmans, and C. M. Oania
Appl. Opt. 18(24) 4067-4079 (1979)

Phase-shifting schlieren: high-resolution quantitative schlieren that uses the phase-shifting technique principle

Luc Joannes, Frank Dubois, and Jean-Claude Legros
Appl. Opt. 42(25) 5046-5053 (2003)