Abstract

Coefficients that characterize the contribution to the total waveguide dispersion from guide geometry and from material dispersion are introduced. These are cast in terms of the normalized parameters of normalized frequency, asymmetry measure, and effective guide index. This allows plotting of universal curves for the dispersion coefficients for step thin film and exponentially graded slab waveguides that are applicable to all such structures.

© 1980 Optical Society of America

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