Abstract

Methods for determining the optical constants of a thin plane–parallel slab are developed without using information from other measurements. For the ideal case (negligible absorption and thickness inhomogeneity), a purely geometrical method even avoids the use of relative intensities. The more realistic situations (weak absorption or gain and finite thickness inhomogeneity) are also discussed. The methods are used to determine the refractive index of CdS platelets below the exciton region at room temperature.

© 1980 Optical Society of America

Determining the absorption coefficient of absorbing thin films with optical waveguides

K. Sasaki, H. Takahashi, Y. Kudo, and N. Suzuki
Appl. Opt. 19(17) 3018-3021 (1980)

Improvements to the spectral transparency method for determining particle-size distribution

A. Ya. Perelman and K. S. Shifrin
Appl. Opt. 19(11) 1787-1793 (1980)

Optical properties of very thin, nonideal multilayer superlattice stacks

A. H. Madjid and A. J. Abu El-Haija
Appl. Opt. 19(15) 2612-2622 (1980)

Multiple determination of the optical constants of thin-film coating materials

D. P. Arndt, R. M. A. Azzam, J. M. Bennett, J. P. Borgogno, C. K. Carniglia, W. E. Case, J. A. Dobrowolski, U. J. Gibson, T. Tuttle Hart, F. C. Ho, V. A. Hodgkin, W. P. Klapp, H. A. Macleod, E. Pelletier, M. K. Purvis, D. M. Quinn, D. H. Strome, R. Swenson, P. A. Temple, and T. F. Thonn
Appl. Opt. 23(20) 3571-3596 (1984)

Method for Determining the Optical Constants of Semitransparent Films

S. E. Webber and S. R. Scharber
Appl. Opt. 10(2) 338-341 (1971)