Abstract

The addition of a simple solid-state photometer to a standard polarizing microscope permits continuous monitoring of the optical path difference of birefringent crystals undergoing solid–solid phase transformations. This approach permits direct recording of phase transformation hysteresis loops for microscopic crystals. Such data offer advantages over conventional birefringence measurements for studies involving phase transformation dynamics.

© 1981 Optical Society of America

High-path-difference optical compensator: its use in the observation of solid-solid phase transformations

L. J. Soltzberg
Appl. Opt. 14(7) 1664-1666 (1975)

Photometric measurement of linear crystallization velocity on a microscale

L. J. Soltzberg, Yvette M. Dick, and Jody M. Stowe
Appl. Opt. 22(4) 619-621 (1983)

Monitoring of optical coatings

H. A. Macleod
Appl. Opt. 20(1) 82-89 (1981)

High-luminosity visible and near-IR Fourier-transform photoacoustic spectrometer

D. Débarre, A. C. Boccara, and D. Fournier
Appl. Opt. 20(24) 4281-4286 (1981)

Images of phase edges in conventional and scanning optical microscopes

T. Wilson
Appl. Opt. 20(18) 3238-3244 (1981)