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Interference-enhanced Raman scattering from TiO2/SiO2 multilayers: measurement and theory

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Abstract

Raman-band intensities for sputter-deposited TiO2/SiO2 multilayer coatings are found to exhibit a strong dependence on excitation wavelength of the probe laser. A model based on standing waves within the stack correctly predicts the magnitude and wavelength dependence of the observed enhancements.

© 1987 Optical Society of America

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