Abstract
In principle, the real n and imaginary k parts of the complex refractive index of a crystal can be determined by measuring, when possible, its transmission and reflection spectra. We show that it is possible to derive the frequency dependence of n and k in a simple way by using exact expressions for the interference-free transmittance and reflectance to describe low-resolution data. We also derive n and k data starting from one high-resolution spectrum. As an example, we have measured the room-temperature transmittance and reflectance of MgO in the far-infrared region. Reliable n and k data are then obtained in the frequency region 50–250 cm−1.
© 1992 Optical Society of America
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