Abstract
An optical configuration is suggested that will achieve a twofold increase in sensitivity when one measures an in-plane displacement component of a deformation vector compared with the Leendertz two-beam illumination method. A theory and experimental demonstration of the method are presented.
© 1993 Optical Society of America
Full Article | PDF ArticleMore Like This
T. Santhanakrishnan, P. K. Palanisamy, and R. S. Sirohi
Appl. Opt. 37(19) 4150-4153 (1998)
T. Santhanakrishnan, P. K. Palanisamy, and R. S. Sirohi
Appl. Opt. 37(16) 3447-3449 (1998)
R. S. Sirohi, J. Burke, H. Helmers, and K. D. Hinsch
Appl. Opt. 36(23) 5787-5791 (1997)