Abstract

It is desirable for design purposes to model a signal-processing-in-the-element (SPRITE) detector simply as a discrete-element detector with an integration-enhanced D*. We present a method for normalization of measured D* for SPRITE detectors to yield an equivalent-discrete D*. The multiplicative factor is the square root of the ratio of two noise-equivalent bandwidths: one is that of the SPRITE detector with no boost filter, and the other is that of the SPRITE detector with a boost filter that approximately compensates for carrier diffusion, yielding a spatial resolution that approaches that of a discrete detector the same size as the readout. This approach allows a resolution-equivalent D* comparison of SPRITE detectors with discrete-element detectors and facilitates such comparisons among SPRITE detectors. We find that, to obtain the D* of an equivalent-discrete detector, a measured SPRITE D* should typically be multiplied by a factor ranging from 0.85 to 0.57 for 8- to 12-μm SPRITE detectors and by a factor ranging from 0.50 to 0.23 for 3- to 5-μm SPRITE detectors.

© 1995 Optical Society of America

Modulation transfer function and number of equivalent elements for SPRITE detectors

Glenn D. Boreman and Allen E. Plogstedt
Appl. Opt. 27(20) 4331-4335 (1988)

Modal analysis of transport processes in SPRITE detectors

Frank J. Effenberger and Glenn D. Boreman
Appl. Opt. 34(22) 4651-4661 (1995)

Modulation-transfer function measurement of SPRITE detectors: sine-wave response

Kenneth J. Barnard, Glenn D. Boreman, Allen E. Plogstedt, and Barry K. Anderson
Appl. Opt. 31(1) 144-147 (1992)

Modulation-transfer-function-enhanced readout for SPRITE detectors

Frank J. Effenberger and Glenn D. Boreman
Appl. Opt. 35(7) 1022-1024 (1996)

Spatial filtering by a line-scanned nonrectangular detector: application to SPRITE readout MTF

Glenn D. Boreman and Allen E. Plogstedt
Appl. Opt. 28(6) 1165-1168 (1989)