Abstract
Computer codes that are based on Elson’s theory for light scattering by interfacial roughness in multilayer coatings were used to predict the bidirectional reflectance-distribution function (BRDF) of several opaque coatings from surface-roughness profiles measured by either a scanning–tunneling microscope or an atomic-force microscope. The predictions usually agreed with measured BRDF values to within a factor of 2. The coatings consisted of single layers of Ag or Ni and dielectric stacks with up to three layers.
© 1995 Optical Society of America
Full Article |
PDF Article
More Like This
Cited By
You do not have subscription access to this journal. Cited by links are available to subscribers only. You may subscribe either as an Optica member, or as an authorized user of your institution.
Contact your librarian or system administrator
or
Login to access Optica Member Subscription
Figures (17)
You do not have subscription access to this journal. Figure files are available to subscribers only. You may subscribe either as an Optica member, or as an authorized user of your institution.
Contact your librarian or system administrator
or
Login to access Optica Member Subscription
Tables (4)
You do not have subscription access to this journal. Article tables are available to subscribers only. You may subscribe either as an Optica member, or as an authorized user of your institution.
Contact your librarian or system administrator
or
Login to access Optica Member Subscription
Equations (2)
You do not have subscription access to this journal. Equations are available to subscribers only. You may subscribe either as an Optica member, or as an authorized user of your institution.
Contact your librarian or system administrator
or
Login to access Optica Member Subscription