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Reflection-wavelength control method for layer-by-layer controlled x-ray multilayer mirrors

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Abstract

A reflection-wavelength control method for a layer-by-layer controlled x-ray multilayer mirror without interface roughness is proposed. The reflection wavelength of the multiperiodic mirror is found to be simply determined by a combination ratio of periodic layers. Multiperiodic x-ray mirrors with reflectance wavelengths at 3.374 nm (C vi 1s–2p) and 3.950 nm (Ca xviii 3d–5f) are successfully designed.

© 1997 Optical Society of America

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