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Effects of reflection-induced retardance on the immunity of bulk optic-material current sensors

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Abstract

Reflection-induced phase retardance inside bulk optic-material current sensors makes the state of polarization of the light change, which reduces the immunity of the sensors against electromagnetic interference. These effects are analyzed theoretically for the first time, to our knowledge. A comparison between the theoretical analysis and the experimental results are given.

© 1998 Optical Society of America

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