Expand this Topic clickable element to expand a topic
Skip to content
Optica Publishing Group

Characterization of background signals in wavelength-modulation spectrometry in terms of a Fourier based theoretical formalism

Not Accessible

Your library or personal account may give you access

Abstract

The detectability of wavelength-modulation (WM) diode-laser spectrometric techniques is frequently limited by various background signals. A new theoretical formalism for WM spectrometry, based on Fourier analysis and therefore capable of handling a variety of phenomena including the characterization and the analysis of analytical as well as background WM signals, was recently presented [Appl. Opt. 38, 5803 (1999)]. We report a detailed characterization of WM background signals from multiple reflections between pairs of surfaces in the optical system that act as etalons and from the associated intensity modulation in terms of this new formalism. The agreement between the background signals from a thin glass plate and those predicted by the formalism is good, which verifies the new Fourier analysis-based formalism.

© 2001 Optical Society of America

Full Article  |  PDF Article
More Like This
Background signals in wavelength-modulation spectrometry by use of frequency-doubled diode-laser light. II. Experiment

Pawel Kluczynski, Åsa M. Lindberg, and Ove Axner
Appl. Opt. 40(6) 794-805 (2001)

Background signals in wavelength-modulation spectrometry with frequency-doubled diode-laser light. I. Theory

Pawel Kluczynski, Åsa M. Lindberg, and Ove Axner
Appl. Opt. 40(6) 783-793 (2001)

Cited By

You do not have subscription access to this journal. Cited by links are available to subscribers only. You may subscribe either as an Optica member, or as an authorized user of your institution.

Contact your librarian or system administrator
or
Login to access Optica Member Subscription

Figures (4)

You do not have subscription access to this journal. Figure files are available to subscribers only. You may subscribe either as an Optica member, or as an authorized user of your institution.

Contact your librarian or system administrator
or
Login to access Optica Member Subscription

Tables (5)

You do not have subscription access to this journal. Article tables are available to subscribers only. You may subscribe either as an Optica member, or as an authorized user of your institution.

Contact your librarian or system administrator
or
Login to access Optica Member Subscription

Equations (23)

You do not have subscription access to this journal. Equations are available to subscribers only. You may subscribe either as an Optica member, or as an authorized user of your institution.

Contact your librarian or system administrator
or
Login to access Optica Member Subscription

Select as filters


Select Topics Cancel
© Copyright 2024 | Optica Publishing Group. All Rights Reserved