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Reply to comment: Absolute measurement of roughness and lateral-correlation length of random surfaces by use of the simplified model of image-speckle contrast

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Abstract

In this reply, we further demonstrate the consistency of the theory and the experimental performance in our previous paper [Appl. Opt. 41, 4148 (2002)]. We expound our point of view that the simultaneous measurement for the roughness and lateral correlation length of random surfaces by use of the simplified model of image speckle contrast is correct and valid, and we point out the differences of our method from those in the literature.

© 2003 Optical Society of America

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