Abstract

Many of the optical properties of irradiated silicon oxide films, relevant to the employment of the films as phase compensating layers for Fabry-Perot surface defects, are determined. Ultraviolet radiation induces complementary changes in thickness and refractive index but does not increase the surface roughness of the films. Partially irradiated films exhibit inhomogeneity of refractive index, and a film model is proposed. The optical properties change with age, but the effects are sometimes small. For example, a step of height 8 nm, induced by irradiating a 143-nm film, changed height by about 0.2 nm over a period of three months.

© 1970 Optical Society of America

Effect of Ultraviolet Irradiation on the Optical Properties of Silicon Oxide Films

A. P. Bradford, G. Hass, M. McFarland, and E. Ritter
Appl. Opt. 4(8) 971-976 (1965)

Solar Absorptivity and Thermal Emissivity of Aluminum Coated with Silicon Oxide Films Prepared by Evaporation of Silicon Monoxide

A. P. Bradford, G. Hass, J. B. Heaney, and J. J. Triolo
Appl. Opt. 9(2) 339-344 (1970)

Compensation of Fabry-Perot Surface Defects. 2: Silicon Oxide Compensating Layers

I. J. Hodgkinson
Appl. Opt. 11(9) 1970-1977 (1972)

Laboratory Experiments to Study Surface Contamination and Degradation of Optical Coatings and Materials in Simulated Space Environments

G. Hass and W. R. Hunter
Appl. Opt. 9(9) 2101-2110 (1970)

UV optical properties of thin film oxide layers deposited by different processes

Samuel F. Pellicori and Carol L. Martinez
Appl. Opt. 50(28) 5559-5566 (2011)