Abstract

It is important to predict the intensity distribution in focusing plane for designing the X-ray compound refractive lenses. On the basis of analyzing the structure of X-ray compound lenses and comparing it with Fraunhofer diffraction system, it is concluded that the X-ray focusing system can be regarded as a kind of Fraunhofer diffraction system. Therefore, a method based on Fourier spectrum analysis is presented to predict the intensity distribution in the focusing plane for the X-ray lenses. A brief analysis on the relationship between the parameters of X-ray lenses and their focusing performance is also given in this paper.

© 2005 Chinese Optics Letters

Focusing high-energy x rays by compound refractive lenses

A. Snigirev, V. Kohn, I. Snigireva, A. Souvorov, and B. Lengeler
Appl. Opt. 37(4) 653-662 (1998)

X-ray focusing with compound lenses made from beryllium

H. R. Beguiristain, J. T. Cremer, M. A. Piestrup, C. K. Gary, and R. H. Pantell
Opt. Lett. 27(9) 778-780 (2002)

Sub-500  nm hard x ray focusing by compound long kinoform lenses

Keliang Liao, Jing Liu, Hao Liang, Xuehui Wu, Kai Zhang, Qingxi Yuan, Futing Yi, and Weifan Sheng
Appl. Opt. 55(1) 38-41 (2016)

X-ray multilens interferometer based on Si refractive lenses

A. Snigirev, I. Snigireva, M. Lyubomirskiy, V. Kohn, V. Yunkin, and S. Kuznetsov
Opt. Express 22(21) 25842-25852 (2014)

Generalized pupil function of a compound X-ray refractive lens

Sergey Gasilov, Tomy dos Santos Rolo, Alberto Mittone, Sergey Polyakov, Sergey Terentyev, Tomas Farago, Vladimir Blank, Alberto Bravin, and Tilo Baumbach
Opt. Express 25(21) 25090-25097 (2017)