Expand this Topic clickable element to expand a topic
Skip to content
Optica Publishing Group
Journal Home About Issues in Progress Current Issue All Issues
  • Journal of Lightwave Technology
  • Vol. 18,
  • Issue 2,
  • pp. 199-
  • (2000)

Near-Infrared Refractive Index of Thick, Laterally Oxidized AlGaAs Cladding Layers

F. Sfigakis, P. Paddon, V. Pacradouni, M. Adamcyk, C. Nicoll, A. R. Cowan, T. Tiedje, and Jeff F. Young

Not Accessible

Your library or personal account may give you access

Abstract

The optical transmission in the range 900-1600 nm was measured through thick (1 m) layers of Al0.98Ga0.02 As wet-oxidized at 375 C on GaAs. The spectra are fit well by neglecting absorption, and using 1.61 for the refractive index.

[IEEE ]

PDF Article
More Like This
Tailoring of embedded dielectric alumina film in AlGaAs epilayer by selective thermal oxidation

Giulio Tavani, Andrea Chiappini, Alexey Fedorov, Francesco Scotognella, Stefano Sanguinetti, Daniel Chrastina, and Monica Bollani
Opt. Mater. Express 12(2) 835-844 (2022)

Optical measurement of the refractive index, layer thickness, and volume changes of thin films

A. H. M. Holtslag and P. M. L. O. Scholte
Appl. Opt. 28(23) 5095-5104 (1989)

Measurement method for the refractive index of thick solid and liquid layers

Branko Šantić, Davor Gracin, and Krunoslav Juraić
Appl. Opt. 48(22) 4430-4436 (2009)

View More...

Cited By

You do not have subscription access to this journal. Cited by links are available to subscribers only. You may subscribe either as an Optica member, or as an authorized user of your institution.

Contact your librarian or system administrator
or
Login to access Optica Member Subscription

Select as filters
Select Topics Cancel
Top
       
© Copyright 2024 | Optica Publishing Group. All rights reserved, including rights for text and data mining and training of artificial technologies or similar technologies.
Privacy | Terms of Use