Abstract
We reported on, to our knowledge the first time, the channel waveguide
formation in $\hbox {KTiOPO}_{4}$ crystal by the implantation of protons with a special designed
photoresist mask. The 2-D refractive index profile was constructed according
to the measured dark-mode spectroscopy (for longitudinally planar configuration)
as well as the shape of the channel waveguide cross section. Based on this
index distribution, the modal profile was calculated through a numerical simulation,
which showed reasonable agreement with the near-field light intensity distribution
of the guided mode that was obtained by an end-coupling method. After annealing
at 200 $^{\circ}\hbox {C}$ for
30 min in air, propagation loss of the channel waveguides was determined to
be as low as $\sim$2.9
dB/cm at wavelength of 632.8 nm.
© 2008 IEEE
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