Abstract

The factors which influence the properties of dielectric films formed by thermal evaporation are discussed. Detailed results are given for several materials which are of practical importance. The results obtained for the refractive index of transparent films (a) by the Brewster angle method and (b) by the measurement of film reflectance are considered. It is concluded that differences observed in certain cases cannot be ascribed to the use of different methods of measurement. Some tentative comments are made on the connection between the observed mechanical stress and structure of films of ZnS, MgF₂, cryolite, LiF, and CaF₂.

© 1957 Optical Society of America

Brewster Angle Apparatus for Thin Film Index Measurements

Alan C. Traub and Harold Osterberg
J. Opt. Soc. Am. 47(1) 62-64 (1957)

Optical Properties of Thin Absorbing Films*

F. Abelès
J. Opt. Soc. Am. 47(6) 473-482 (1957)

Formation of Luminescent Films by Evaporation

Charles Feldman and Margaret O’Hara
J. Opt. Soc. Am. 47(4) 300-305 (1957)

Optical Properties of Magnesium Fluoride Films in the Ultraviolet

Joseph F. Hall
J. Opt. Soc. Am. 47(7) 662-665 (1957)

Determination of the Refractive Index of Thin Dielectric Films*

Michael Hacskaylo
J. Opt. Soc. Am. 54(2) 198-203 (1964)