Abstract

An interferometer for the absolute measurement of the length of end standards is described in which the optical path difference introduced between the interfering beams is only half the length of the gauge. This permits the direct measurement of gauge blocks up to 1 meter long with the isotope sources currently available. Other advantages of the instrument are its relatively compact layout and simplicity of operation.

© 1959 Optical Society of America

Triangular Path Macro-Interferometer

P. Hariharan and D. Sen
J. Opt. Soc. Am. 49(11) 1105-1105 (1959)

Michelson Interferometer as a Remote Gauge

R. A. Patten
Appl. Opt. 10(12) 2717-2721 (1971)

Effect of Surface Roughness on the Phase Change at Reflection in Interferometers

B. S. Thornton
J. Opt. Soc. Am. 49(5) 476-479 (1959)

Interference at Great Retardations Obtained with a Calcium Atomic Beam Source*

K. W. Meissner and V. Kaufman
J. Opt. Soc. Am. 49(5) 434-438 (1959)

A New Type of Interferometer

A. Hoyt
J. Opt. Soc. Am. 26(6) 262-266 (1936)