Abstract

Contrary to a common misconception, it is possible to carry out absolute wavelength measurements with a Fabry–Perot interferometer having dielectric coatings even with no preliminary knowledge of the dispersion of phase change upon reflection. The method involves only a trivial change from that described by Meissner in his classic article on interference spectroscopy. The origin of interferometric wavelength corrections for phase change effects is discussed to emphasize that it is not dispersion of phase change but rather dispersion of optical path which necessitates such corrections.

© 1964 Optical Society of America

Precise Method for Measuring the Absolute Phase Change on Reflection

Jean M. Bennett
J. Opt. Soc. Am. 54(5) 612-624 (1964)

Resolving Power in the Near Infrared of the Fabry–Perot Interferometer with Gold and with Silver Coatings

D. A. Jackson and K. Narahari Rao
J. Opt. Soc. Am. 53(5) 558-567 (1963)

Determination of the Absolute Phase Change on Reflection at Chromium Films

G. Henderson and C. Weaver
J. Opt. Soc. Am. 54(8) 1052-1056 (1964)

Coating Fabry-Perot interferometer plates with broadband multilayer dielectric mirrors

R. P. Netterfield, R. C. Schaeffer, and W. G. Sainty
Appl. Opt. 19(17) 3010-3017 (1980)

Instrument for the Absolute Measurement of Direct Spectral Reflectances at Normal Incidence

J. E. Shaw and W. R. Blevin
J. Opt. Soc. Am. 54(3) 334-336 (1964)