Abstract

The reflectance and optical constants of evaporated iridium films were measured in the wavelength region from 500 to 2000 Å. The films were evaporated by electron bombardment and deposited at various rates onto glass substrates of various temperatures. Their optical constants were determined from reflectance measurements made at different angles of incidence. In contrast to aluminum and other oxide-film-forming metals, iridium showed very little change in reflectance during exposure to air. Films with highest normal incidence reflectance were obtained by evaporation onto substrates heated to 300°C and more. Owing to interference, semitransparent films of 100 to 200 Å on glass showed higher reflectance than opaque films at most wavelengths in the vacuum ultraviolet. Iridium films produced under optimum conditions had a reflectance of about 27% at 550 Å.

© 1967 Optical Society of America

Optical Properties of Evaporated Rhodium Films Deposited at Various Substrate Temperatures in the Vacuum Ultraviolet from 150 to 2000 Å*

J. Thomas Cox, G. Hass, and W. R. Hunter
J. Opt. Soc. Am. 61(3) 360-364 (1971)

Reflectance and optical constants of evaporated osmium in the vacuum ultraviolet from 300 to 2000 Å*

J. T. Cox, G. Hass, J. B. Ramsey, and W. R. Hunter
J. Opt. Soc. Am. 63(4) 435-438 (1973)

Reflectance and optical constants of evaporated ruthenium in the vacuum ultraviolet from 300 to 2000 Å*

J. T. Cox, G. Hass, J. B. Ramsey, and W. R. Hunter
J. Opt. Soc. Am. 64(4) 423-428 (1974)

Calculated Reflectance of Aluminum-Overcoated Iridium in the Vacuum Ultraviolet from 500 Å to 2000 Å

G. Hass and W. R. Hunter
Appl. Opt. 6(12) 2097-2100 (1967)

Reflectance of Evaporated Rhenium and Tungsten Films in the Vacuum Ultraviolet from 300 to 2000 Å*

J. T. Cox, G. Hass, J. B. Ramsey, and W. R. Hunter
J. Opt. Soc. Am. 62(6) 781-785 (1972)