Abstract

The optimum depth of modulation has been evaluated for instruments employing the Faraday effect for modulation and compensation. The optimum modulation depth has been shown to vary both with the fraction of depolarized light passing through the system and with the importance assigned to angular resolution, wavelength resolution, and speed of response. A comparison has been made of the responses for a commonly used modulation angle and the optimized angle.

© 1973 Optical Society of America

Effects of component imperfections on ellipsometer calibration

William Ralph Hunter
J. Opt. Soc. Am. 63(8) 951-957 (1973)

Modified Jones calculus for the analysis of errors in polarization-modulation ellipsometry*

Robert C. O’Handley
J. Opt. Soc. Am. 63(5) 523-528 (1973)

Ellipsometry of anisotropic surfaces

D. J. De Smet
J. Opt. Soc. Am. 63(8) 958-964 (1973)

Extended theory of light modulation in thin-screen diffraction by ultrasound

F. Calligaris, P. Ciuti, and I. Gabrielli
J. Opt. Soc. Am. 63(3) 287-292 (1973)

Optimizing precision of rotating-analyzer ellipsometers

D. E. Aspnes
J. Opt. Soc. Am. 64(5) 639-646 (1974)