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Enhanced total reflection with surface plasmons

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Abstract

The total internal reflectance of a homogeneous amplifying medium in contact with a thin silver film which is evaporated on a high-index prism is determined theoretically with the help of the Fresnel formulas. At the angle of incidence for surface-plasmon excitation the reflectance is reasonantly enhanced when the gain of the amplifying medium exceeds a value determined by the absorption of the metal film. For any value of gain above threshold there exists a thickness of the silver film for which the reflectance has a singular point. A device utilizing this resonance would be possible near 1 μ where the absorption of the silver is at a minimun and high-gain dyes are available.

© 1979 Optical Society of America

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Equations (7)

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