Abstract

Measurements of the polarization states (represented by complex numbers χ_r and χ_t, respectively) of light reflected and transmitted by an unsupported or embedded thin film, for totally polarized light (with nonzero p and s components) incident at 45°, permit simple, direct, and explicit determination of the film’s complex refractive index N₁independently of film thickness or input polarization. If α = χ_r/χ_t, we find that α = r_s + r_s⁻¹, where r_s is Fresnel’s complex reflection coefficient of the ambient–film interface for the s polarization at 45° incidence. From α, r_s is determined, and from r_s we get N₁ = N₀(1 + r_s²)^1/2/(1 + r_s), where N₀ is the refractive index of the transparent medium surrounding the film. Knowledge of the incident polarization χ_i allows the film thickness to be determined, also explicitly, by using either of the ratios χ_i/χ_r or χ_i/χ_t.

© 1983 Optical Society of America

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