Expand this Topic clickable element to expand a topic
Skip to content
Optica Publishing Group

Achromatic angle-insensitive infrared quarter-wave retarder based on total internal reflection at the Si–SiO2 interface

Not Accessible

Your library or personal account may give you access

Abstract

An achromatic infrared (λ=1.24 μm), Si-prism quarter-wave retarder (QWR) is described that uses total internal reflection at a buried SiSiO2 interface at an angle of incidence ϕ near 33°, where Δ/ϕ=0. The retardance Δ deviates from 90° by <±2° within a field of view of ±10° (in air) over the entire bandwidth. Because the SiO2 layer at the base of the prism is optically thick, this QWR is unaffected by environmental contamination.

© 2004 Optical Society of America

Full Article  |  PDF Article
More Like This
Polarization properties of retroreflecting right-angle prisms

R. M. A. Azzam and H. K. Khanfar
Appl. Opt. 47(3) 359-364 (2008)

Cited By

You do not have subscription access to this journal. Cited by links are available to subscribers only. You may subscribe either as an Optica member, or as an authorized user of your institution.

Contact your librarian or system administrator
or
Login to access Optica Member Subscription

Figures (6)

You do not have subscription access to this journal. Figure files are available to subscribers only. You may subscribe either as an Optica member, or as an authorized user of your institution.

Contact your librarian or system administrator
or
Login to access Optica Member Subscription

Equations (9)

You do not have subscription access to this journal. Equations are available to subscribers only. You may subscribe either as an Optica member, or as an authorized user of your institution.

Contact your librarian or system administrator
or
Login to access Optica Member Subscription

Select as filters


Select Topics Cancel
© Copyright 2024 | Optica Publishing Group. All Rights Reserved