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Explicit asymptotic formulas for the positions, widths, and strengths of resonances in Mie scattering

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Abstract

Explicit asymptotic formulas are derived for the positions, widths, and strengths of the morphology-dependent resonances in Mie scattering. These formulas are compared with numerical data and found to be highly accurate, especially for the low-order resonances most relevant to nonlinear processes. They permit the interpretation of experimental data on light scattering from microdroplets without resorting to the full apparatus of the Mie scattering formalism.

© 1992 Optical Society of America

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Equations (55)

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