Abstract

A new technique of optical interferometry based on the statistics of the fully developed speckle field is proposed. It is revealed that the complete randomness of the speckle phase can play the role of a standard phase in a statistical sense, and the phase of the object under testing can be derived in a statistical way, in contrast to conventional interferometry. The technique is first described in relation to the phase-shifting interferometry and the compensation problem for the phase-shift error. Next the method is generalized as an independent interferometric technique.

© 1991 Optical Society of America

Statistical interferometry based on a fully developed speckle field: an experimental demonstration with noise analysis

Hirofumi Kadono, Yoshinori Bitoh, and Satoru Toyooka
J. Opt. Soc. Am. A 18(6) 1267-1274 (2001)

Speckle-shearing interferometry using a liquid-crystal cell as a phase modulator

H. Kadono, S. Toyooka, and Y. Iwasaki
J. Opt. Soc. Am. A 8(12) 2001-2008 (1991)

Technique for the removal of speckle phase in electronic speckle interferometry

Bruno F. Pouet and Sridhar Krishnaswamy
Opt. Lett. 20(3) 318-320 (1995)

Speckle statistics from gamma-distributed random-phase screens

Héctor M. Escamilla and Eugenio R. Méndez
J. Opt. Soc. Am. A 8(12) 1929-1935 (1991)

First-order statistics of displayed speckle patterns in electronic speckle pattern interferometry

Gudmunn Å. Slettemoen
J. Opt. Soc. Am. 71(4) 474-482 (1981)