Abstract
We propose optical path-length spectroscopy as a new approach to obtaining information from media that exhibit multiple light scattering. By using a backscattering technique based on low-coherence interferometry, we are able to determine the optical path-length distribution for light reflected from a random medium and to infer the value of the transport mean free path. We illustrate how a diffusion approximation model leads to a satisfactory description of depth-resolved profiles of the backscattered intensity and discuss potential applications of this technique.
© 1999 Optical Society of America
Full Article | PDF ArticleMore Like This
A. Ya. Polishchuk, J. Dolne, F. Liu, and R. R. Alfano
Opt. Lett. 22(7) 430-432 (1997)
D. A. Boas, K. K. Bizheva, and A. M. Siegel
Opt. Lett. 23(5) 319-321 (1998)
A. Dogariu, C. Kutsche, P. Likamwa, G. Boreman, and B. Moudgil
Opt. Lett. 22(9) 585-587 (1997)