Abstract

This Letter investigates the effects of different phase-shifting algorithms on the quality of high-resolution three-dimensional (3-D) profilometry produced with nearly focused binary patterns. From theoretical analyses, simulations, and experiments, we found that the nine-step phase-shifting algorithm produces accurate 3-D measurements at high speed without the limited depth range and calibration difficulties that typically plague binary defocusing methods. We also found that the use of more fringe patterns does not necessarily enhance measurement quality.

© 2011 Optical Society of America

High-resolution 3D profilometry with binary phase-shifting methods

Song Zhang
Appl. Opt. 50(12) 1753-1757 (2011)

Three-dimensional profiling with binary fringes using phase-shifting interferometry algorithms

Gastón A. Ayubi, J. Matías Di Martino, Julia R. Alonso, Ariel Fernández, César D. Perciante, and José A. Ferrari
Appl. Opt. 50(2) 147-154 (2011)

Regularized multiframe phase-shifting algorithm for three-dimensional profilometry

Fuqin Deng, Wui Fung Sze, Jiangwen Deng, Kenneth S. M. Fung, W. H. Leung, and Edmund Y. Lam
Appl. Opt. 51(1) 33-42 (2012)

Superfast multifrequency phase-shifting technique with optimal pulse width modulation

Yajun Wang and Song Zhang
Opt. Express 19(6) 5149-5155 (2011)

Optimized pulse width modulation pattern strategy for three-dimensional profilometry with projector defocusing

Chao Zuo, Qian Chen, Shijie Feng, Fangxiaoyu Feng, Guohua Gu, and Xiubao Sui
Appl. Opt. 51(19) 4477-4490 (2012)