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Conferences > BIOMED > 2010 > JMA > JMA5

Multidimensional Metrology Based On Multicolor Digital Fresnel Holography

Patrice Tankam, Pascal Picart, Denis Mounier, Jean Pierre Boileau, Vincent Tournat, and Vitali Goussev

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Abstract

Multidimensional metrology is made possible using multicolor digital Fresnel holography. Adapted algorithm with specific zero padding depending on wavelength allows deformation maps to be reconstructed. Examples include bringing out the existence of in-plane swirling vibration modes in granular material and investigation of electronic component cracking.

© 2010 Optical Society of America

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