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Conferences > CLEO > 2004 > CThD > CThD4
  • Conference on Lasers and Electro-Optics/International Quantum Electronics Conference and Photonic Applications Systems Technologies
  • Technical Digest (CD) (Optica Publishing Group, 2004),
  • paper CThD4

Scaling laws of femtosecond laser induced breakdown in dielectric films

M. Mero, J. Liu, A. J. Sabbah, J. Zeller, P. M. Alsing, J. K. McIver, W. Rudolph, and J. Jasapara

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Abstract

Measured pulse duration and band-gap scaling of the laser breakdown threshold in oxide dielectrics is explained by multiphoton and impact ionization, and relaxation. Formation of self-trapped excitons on a sub-ps time scale is observed.

© 2004 Optical Society of America

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