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  • Conference on Lasers and Electro-Optics/Quantum Electronics and Laser Science Conference and Photonic Applications Systems Technologies
  • Technical Digest (CD) (Optica Publishing Group, 2006),
  • paper CWJ6

Two-dimensional spectral shearing interferometry (2DSI) for ultrashort pulse characterization

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Abstract

We present a new pulse characterization method based on two-dimensional spectral shearing interferometry with zero delay. It features simple calibration, greatly relaxed spectrometer resolution, and is well suited for few-cycle laser pulses.

© 2006 Optical Society of America

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