Tip-to-Sample Distance Control in Apertureless Near-Field Optical microscopy

A.A. Milner; Kaiyin Zhang; Yehiam Prior

Conference on Lasers and Electro-Optics/Quantum Electronics and Laser Science Conference and Photonic Applications Systems Technologies
OSA Technical Digest Series (CD) (Optica Publishing Group, 2007),
paper JThD108

Tip-to-Sample Distance Control in Apertureless Near-Field Optical microscopy

A.A. Milner, Kaiyin Zhang, and Yehiam Prior

Conference on Lasers and Electro-Optics 2007

Baltimore, Maryland United States
6–11 May 2007
ISBN: 1557528349

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Poster Session III (JThD)

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A. A. Milner, K. Zhang, and Y. Prior, "Tip-to-Sample Distance Control in Apertureless Near-Field Optical microscopy," in Conference on Lasers and Electro-Optics/Quantum Electronics and Laser Science Conference and Photonic Applications Systems Technologies, OSA Technical Digest Series (CD) (Optica Publishing Group, 2007), paper JThD108.

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Abstract

Novel mode of AFM operation is proposed providing the small, few nanometers tip to sample gap, appropriate for the ANSOM experiments. A set-up open for the run-time adjustments, working at ambient conditions is considered.

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