Mode Imaging and Dispersion Analysis in Terahertz Waveguides using Terahertz Near-field Microscopy

Oleg Mitrofanov; Thomas Tan; Paul R. Mark; Bradley Bowden; James A. Harrington

doi:10.1364/CLEO.2009.CWM1

Conference on Lasers and Electro-Optics/International Quantum Electronics Conference
OSA Technical Digest (CD) (Optica Publishing Group, 2009),
paper CWM1
•https://doi.org/10.1364/CLEO.2009.CWM1

Mode Imaging and Dispersion Analysis in Terahertz Waveguides using Terahertz Near-field Microscopy

Oleg Mitrofanov, Thomas Tan, Paul R. Mark, Bradley Bowden, and James A. Harrington

Conference on Lasers and Electro-Optics 2009

Baltimore, Maryland United States
31 May–5 June 2009
ISBN: 978-1-55752-869-8

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THz Imaging (CWM)

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O. Mitrofanov, T. Tan, P. R. Mark, B. Bowden, and J. A. Harrington, "Mode Imaging and Dispersion Analysis in Terahertz Waveguides using Terahertz Near-field Microscopy," in Conference on Lasers and Electro-Optics/International Quantum Electronics Conference, OSA Technical Digest (CD) (Optica Publishing Group, 2009), paper CWM1.

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Abstract

Mode structure, transmission loss and dispersion are characterized in low-loss (~1dB/m) Terahertz (THz) dielectric-lined hollow metallic waveguides. THz near-field probe imaging and spectroscopy is applied for precise mode imaging and selective mode probing.

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