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Conferences > CLEO_SI > 2013 > CTu2I > CTu2I.3

Fast high-precision distance measurements on scattering technical surfaces using frequency combs

C. Weimann, D. Meier, S. Wolf, Y. Schleitzer, M. Totzeck, A. Heinrich, F. Hoeller, J. Leuthold, W. Freude, and C. Koos

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Abstract

Using modulator-generated optical frequency combs we measure the distance to scattering technical surfaces. We achieve measurement errors below 10 µm, a dynamic range of over 37 dB and an acquisition time of 8.3 µs.

© 2013 Optical Society of America

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