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Integrated Silicon Nanophotonics for High-bandwidth Chip-to-Chip Communications

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Abstract

Silicon Nanophotonics enables dense integration of electrical circuits with optical devices scaled down to diffraction limit. I will describe how chip-to-chip optical interconnects can be designed starting from devices up to a system level. 150-word Biography: Dr. Yurii Vlasov is a Manager of a Silicon Nanophotonics Project at the IBM Research. For the last 12 years at IBM he has been focused on the development of silicon nanophotonics technology, starting from initial exploratory fundamental research followed by advanced device engineering and, most recently, manufacturing and product development. Dr.Vlasov is currently leading the company-wide effort on transitioning the IBM Silicon Nanophotonics technology to commercial manufacturing for products relevant to IBM business. Prior to IBM, Dr. Vlasov developed semiconductor nanophotonics at the NEC Research Institute in Princeton, and at the Strasbourg IPCMS Institute, France. He also was, for over a decade, a Research Scientist with the Ioffe Institute of Physics and Technology in St. Petersburg, Russia working on optics of nanostructured semiconductors. He received his MS from the University of St.Petersburg (1988) and PhD from the Ioffe Institute (1994), both in physics. Dr. Vlasov has published over 300 highly cited journal and conference papers, filed over 50 US patents, and delivered over 100 invited, plenary and tutorial talks in the area of nanophotonics. He served on numerous organizing committees of conferences on nanophotonics under OSA, IEEE, APS, MRS, etc. Dr. Vlasov was elected a Fellow of both the OSA and the APS, as well as a Senior Member of the IEEE. He was awarded several IBM Outstanding Technical Achievement Awards, the “Best of IBM” Award and the IBM 2012 Corporate Award, as well as SciAm50 Award by the Scientific American journal. For a couple of years Dr. Vlasov also served as an Adjunct Professor at Columbia University's Department of Electrical Engineering.

© 2013 Optical Society of America

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