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Diffraction and the lineshape of Fourier transform spectrometers

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Abstract

The instrument lineshape (ILS) of an on-axis monochromatic plane wave diffracted by the aperture stop is first calculated. This corresponds to the diffracted lineshape of a point source in the center of the field of view (FOV). This diffracted lineshape is then compared to the contribution, without diffraction, of a finite field of view on the ILS. With this comparison, a condition is derived for the diffraction to be a negligible effet on the ILS. The condition depends only upon the throughput and upon the minimal wavenumber observed. When the condition is not respected, numerical calculations must be carried to include the contribution of the diffraction on the ILS.

© 2001 Optical Society of America

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