Abstract

The measurement of attosecond XUV pulses is an important enabler for their generation and application. Several methods now exist for characterizing the electric fields of such pulses, predominantly adapted from methods developed for the femtosecond regime, but making use of a different nonlinearity - the acceleration of photoionized electrons in an external optical field. Recently, however, it has been shown that measurements directly in the XUV can also provide this informational] and this opens the door to the possibility of much more sensitive characterization schemes.

© 2005 Optical Society of America