High Resolution - Extended Depth of Field Imaging

Eyal Ben-Eliezer; Emanuel Marom; Naim Konforti; Leah Bar; Nahum Kiryati

doi:10.1364/FIO.2006.FWR5

Frontiers in Optics
OSA Technical Digest (CD) (Optica Publishing Group, 2006),
paper FWR5
•https://doi.org/10.1364/FIO.2006.FWR5

High Resolution - Extended Depth of Field Imaging

Eyal Ben-Eliezer, Emanuel Marom, Naim Konforti, Leah Bar, and Nahum Kiryati

Frontiers in Optics 2006

Rochester, New York United States
10–13 October 2006
ISBN: 1-55752-818-7

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General Optical Design and Instrumentation II (FWR)

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E. Ben-Eliezer, E. Marom, N. Konforti, L. Bar, and N. Kiryati, "High Resolution - Extended Depth of Field Imaging," in Frontiers in Optics, OSA Technical Digest (CD) (Optica Publishing Group, 2006), paper FWR5.

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Abstract

A pupil phase mask, designed for incoherently illuminated scenes, allows imaging with significantly increased depth of field, while maintaining acceptable resolution and color preservation. Color and contrast of the resulting images may be enhanced digitally.

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