Expand this Topic clickable element to expand a topic
Skip to content
Optica Publishing Group

Total Internal Reflection Microscopy: Calibration of the Intensity-Position Relation

Not Accessible

Your library or personal account may give you access

Abstract

TIRM measures particle-wall interaction potentials with nanometer and femtonewton resolution. Crucial is the knowledge of the scattering intensity-position relation I(z), usually assumed a priori exponential. The experimental determination of I(z) greatly enlarges the accessible conditions.

© 2010 Optical Society of America

PDF Article
More Like This
A New Method for Total Internal Reflection Microscopy (TIRM)

Derrek Wilson and Surendra Singh
FTu3A.36 Frontiers in Optics (FiO) 2012

Geometric Calibration of Omnidirectional Images for Panoramic Total Internal Reflection Lens

Po-Hsuan Huang, Ming-Fu Chen, Yung-Hsinag Chen, Ting-Ming Huang, and Chia-Yen Chan
FThP3 Frontiers in Optics (FiO) 2010

Quantitative characterization of cellular adhesions with Total Internal Reflection Holographic Microscopy

William M. Ash, David Clark, Chun-Min Lo, and Myung K. Kim
DTuA4 Digital Holography and Three-Dimensional Imaging (DH) 2010

Select as filters


Select Topics Cancel
© Copyright 2024 | Optica Publishing Group. All rights reserved, including rights for text and data mining and training of artificial technologies or similar technologies.