General Sine Condition for Plane-Symmetric Imaging Systems and Some Example Aplanatic Designs

Chunyu Zhao

doi:10.1364/IODC.2006.MC3

International Optical Design
Technical Digest (CD) (Optica Publishing Group, 2006),
paper MC3
•https://doi.org/10.1364/IODC.2006.MC3

General Sine Condition for Plane-Symmetric Imaging Systems and Some Example Aplanatic Designs

Chunyu Zhao

International Optical Design Conference 2006

Vancouver Canada
4–8 June 2006
ISBN: 1-55752-811-X

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Aberration Theory (MC)

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C. Zhao, "General Sine Condition for Plane-Symmetric Imaging Systems and Some Example Aplanatic Designs," in International Optical Design, Technical Digest (CD) (Optica Publishing Group, 2006), paper MC3.

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Abstract

General sine condition for plane-symmetric imaging system has been derived before. Here we present some special types of plane-symmetric aplanatic imaging systems to show the effectiveness of the condition.

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