Nonlinear refractive index lineshape determination of Nd:YAG crystal around 590 nm absorption band

D. N. Messias; W. J. Lima; T. Catunda

doi:10.1364/LAOP.2010.MB18

Latin America Optics and Photonics Conference
OSA Technical Digest (CD) (Optica Publishing Group, 2010),
paper MB18
•https://doi.org/10.1364/LAOP.2010.MB18

Nonlinear refractive index lineshape determination of Nd:YAG crystal around 590 nm absorption band

D. N. Messias, W. J. Lima, and T. Catunda

Latin America Optics and Photonics Conference 2010

Recife Brazil
27–30 September 2010
ISBN: 978-1-55752-903-9

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Joint Poster Session I (MB)

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D. N. Messias, W. J. Lima, and T. Catunda, "Nonlinear refractive index lineshape determination of Nd:YAG crystal around 590 nm absorption band," in Latin America Optics and Photonics Conference, OSA Technical Digest (CD) (Optica Publishing Group, 2010), paper MB18.

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Abstract

Nonlinear refractive index measurements were performed in Nd:YAG crystal around 590 nm excitation. The spectral lineshape of n₂ around the absorption peak presented a lorentzian lineshape.

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