Abstract

SIBS is a recently developed analytical method based upon atomic fluorescence emitted following the formation of an electrically generated pulsed plasma on the surface of a non-conductive sample. This plasma ablates and ionizes a portion of the sample. As in the more familiar laser-induced breakdown spectroscopy (LIBS), this plasma is allowed to cool and recombine prior to observing the atomic fluorescence from the sample. The wavelength and the intensity of these atomic features are used to identify the element of interest and quantify the amount present, respectively.

© 2002 Optical Society of America