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Second-harmonic generation spectroscopic study of silicon nanocrystals embedded in SiO2

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Abstract

Cross-polarized 2-beam second-harmonic generation, with enhanced signal from both the nano-interface and the nanocrystal bulk, supplemented with spectroscopic ellipsometry and Raman spectroscopy, has been applied spectroscopically to study the embedded Si NCs of different sizes.

© 2011 Optical Society of America

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