Simplified inverse Fourier transform technique to determine second-order optical nonlinearity profiles using a reference sample

A. Ozcan; M. J. F. Digonnet; G. S. Kino

Optical Fiber Communication Conference
Technical Digest (CD) (Optica Publishing Group, 2004),
paper FC3

Simplified inverse Fourier transform technique to determine second-order optical nonlinearity profiles using a reference sample

A. Ozcan, M. J. F. Digonnet, and G. S. Kino

Optical Fiber Communication Conference 2004

Los Angeles, California United States
ISBN: 1-55752-767-9

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Fiber Devices and Measurements (FC)

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A. Ozcan, M. J. F. Digonnet, and G. S. Kino, "Simplified inverse Fourier transform technique to determine second-order optical nonlinearity profiles using a reference sample," in Optical Fiber Communication Conference, Technical Digest (CD) (Optica Publishing Group, 2004), paper FC3.

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Abstract

A new technique to uniquely determine the nonlinearity profile of nonlinear thin films using a known reference sample is demonstrated. This method is simpler, faster, and experimentally easier to implement than earlier techniques.

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