Grating-Slit: an unusual optical surface test

Chao-Wen Liang; Jose Sasian

doi:10.1364/OFT.2006.OFWA4

Frontiers in Optics
OSA Technical Digest (CD) (Optica Publishing Group, 2006),
paper OFWA4
•https://doi.org/10.1364/OFT.2006.OFWA4

Grating-Slit: an unusual optical surface test

Chao-Wen Liang and Jose Sasian

Optical Fabrication and Testing 2006

Rochester, New York United States
9–11 October 2006
ISBN: 1-55752-818-7

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Uncommon Ideas and Often Missed Details: In Memory of Frank Cooke (OFWA)

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C. Liang and J. Sasian, "Grating-Slit: an unusual optical surface test," in Frontiers in Optics, OSA Technical Digest (CD) (Optica Publishing Group, 2006), paper OFWA4.

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Abstract

This method uses a DMD chip to generate a sinusoidal grating as the light source and uses a slit modulating light at the image location. The transverse ray aberration function is obtained through phase shifting.

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